SPECTRO LFP S.3
| Code | Weight | Quantity | Dimensions cm. L x P x H | Useful dimension mm | Model | Name | request |
|---|---|---|---|---|---|---|---|
| LCST0900 | 11 Kg | 1 | 57,4x43,3x16 | 290x200 (area) | SPECTRO LFP S.3 | SPECTROPHOTOMETER | estimate |
| LMSO01168 | 1 | PROFILE-XPERT PRINT 4C | SOFTWARE | estimate |
USE:
The Spectro LFP Series 3 spectrophotometer is a fundamental instrument for calibration of inkjet digital printers.
It determines the spectral reflection curve.
A diffraction grating inside the monochromator splits the reflected light of the sample into its single wavelength between 360 and 700 nanometres (nm). The intensity of the reflected light of the single wavelength is measured by a photodiode battery to determine the spectral reflectance factor of the object (R%).
The software processes this data displaying the spectral reflectance values on the computer with a 5 or 10 nm pitch or graphically by means of the so-called reflectance curves.
DESCRIPTION AND FEATURES:
For transparent and reflecting materials.
Some examples of materials which can be measured in a fully automatic way: fabrics, glass, backlit film, paper, vinyl, cardboard, plastic plates, chalk sheets, wood, stone and ceramics.
Switchable measuring opening of 2.6 and 8 mm.
Measuring of heavy and thick materials.
3 types of reading (automatic, single, density).
Automatic calibration with automatic reference blank.
USB interface for Mac, PC and Linux RS232.
Supported by most RIP software.
Measuring speed: approx. 10min. for 1248 fields. Maximum measuring surface: 290 x 200 mm (11.42 x 7.87in).
Max. thickness target 20mm (0.79in).
Smallest step measurement: 0.2 mm (0.25mm).
OPENING MEASUREMENT
Reflection and transmission 2.6 and 8 mm (0.08, 0.24 and 0.31in) (switchable).
GEOMETRY
Reflection at 45 ° / 0 °.
Transmission d / 0 °.
Physical lighting: type A.
Measuring time: <0.3 sec.
Repeatability: <0.2 ∆E94 on blank or ± 0.005 D (up to 1.000D).
Measuring sensor: diffraction grating with diodes.
Spectral resolution: 3.5 nm.
Spectral field: 380 ... 780nm
Measuring field density: 0 ... 2.3D.
Weight: 11kg.
SYSTEM REQUIREMENTS
Microsoft Windows XP or later versions (32 and 64 bit).
Mac OS X 10.5 or higher (Intel).
The Spectro LFP Series 3 spectrophotometer is a fundamental instrument for calibration of inkjet digital printers.
It determines the spectral reflection curve.
A diffraction grating inside the monochromator splits the reflected light of the sample into its single wavelength between 360 and 700 nanometres (nm). The intensity of the reflected light of the single wavelength is measured by a photodiode battery to determine the spectral reflectance factor of the object (R%).
The software processes this data displaying the spectral reflectance values on the computer with a 5 or 10 nm pitch or graphically by means of the so-called reflectance curves.
DESCRIPTION AND FEATURES:
For transparent and reflecting materials.Some examples of materials which can be measured in a fully automatic way: fabrics, glass, backlit film, paper, vinyl, cardboard, plastic plates, chalk sheets, wood, stone and ceramics.Switchable measuring opening of 2.6 and 8 mm.Measuring of heavy and thick materials.3 types of reading (automatic, single, density).Automatic calibration with automatic reference blank.USB interface for Mac, PC and Linux RS232.Supported by most RIP software.Measuring speed: approx. 10min. for 1248 fields. Maximum measuring surface: 290 x 200 mm (11.42 x 7.87in).Max. thickness target 20mm (0.79in).Smallest step measurement: 0.2 mm (0.25mm).OPENING MEASUREMENT
Reflection and transmission 2.6 and 8 mm (0.08, 0.24 and 0.31in) (switchable). GEOMETRY
Reflection at 45 ° / 0 °.Transmission d / 0 °.Physical lighting: type A.Measuring time: <0.3 sec.Repeatability: <0.2 ∆E94 on blank or ± 0.005 D (up to 1.000D).Measuring sensor: diffraction grating with diodes.Spectral resolution: 3.5 nm.Spectral field: 380 ... 780nmMeasuring field density: 0 ... 2.3D.Weight: 11kg.SYSTEM REQUIREMENTS
Microsoft Windows XP or later versions (32 and 64 bit).Mac OS X 10.5 or higher (Intel).
